Showing results: 61 - 75 of 82 items found.
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Vanta iX -
Evident Scientific
The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
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FISCHERSCOPE XDV-µ -
Helmut Fischer AG
Measuring instrument optimised for micro-analysisDepending on the X-ray optics, structures with a size of100 m or less can be analysedVery high intensities and thus good precisionEven for thin coatings, measurement uncertainty < 1 nm possibleSuitable only for plane or nearly plane samplesLarge and spacious measurement chamber with a cutout(C-slot)Automated series testing with fast, programmable XY-stage
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Polymer Solutions
Work we''ve done: Coating identification, Measuring lead levels in paint and solder, Elemental comparison of two metal ingots, Restriction of Hazardous Substance (RoHS) testing.
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Skyray Instruments
Is a non-destructive analytical technique used to determine the elemental composition of materials.
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FISCHERSCOPE X-RAY/XUL -
Helmut Fischer AG
For coating thickness measurements in the electroplating industryFixed aperture and fixed primary filterX-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at about 1 mmLow-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problemMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot) Standard X-ray tube, proportional counter tube
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MESA-7220V2 -
HORIBA, Ltd.
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
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AMMS-100 XRF -
Focused Photonics Inc.
The system integrates X-ray fluorescence for metal analysis up to 30 elements and a beta-ray attenuation model for particulate mass monitoring. But module will be using the same sample moving sequentially across the detector and would be significantly effective in industry emission tracing.
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Shimadzu Corp.
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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SPECTRO MIDEX -
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
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Micromatter
We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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FISCHERSCOPE X-RAY/XAN 500 -
Helmut Fischer AG
Mobile measurement of coatings on large parts such as housings, machine components or pipes Stationary measurement on small parts; the compact carrying case transforms the device into a complete desktop unitThree-point sample support ensures safe, and repeatable measuring, and accommodates curved surfacesTime-effective measurement even without calibration due to FISCHER's fundamental parameterEvaluation and presentation of measurement data on a tablet PC (via Bluetooth) using the proven software WinFTM
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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Sydor Technologies
Photek photon-counting camera systems are unique as they provide the ability to capture and integrate an image in real time. These systems are ideal for extremely low photon emission applications such as bio-luminescence, chemi-luminescence and weak fluorescence. The ability to accurately analyze transient events is a key feature of this product. The length of time that the image can be integrated is limited only by disc space, and allows the user to fully capture real-time events. X, Y and time co-ordinates for post acquisition analysis is also recorded. X-ray and vacuum imaging camera options are also available.
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FISCHERSCOPE X-RAY 5000 -
Helmut Fischer AG
Flange measuring head for continuous measurements in production linesProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorQuick and easy calibration on a workpiece master directly in the production processFor use in air or vacuumAllows measurements even on very hot substrate materials up to 500 C (930 F)Design is focused on maximum robustness and serviceability
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FISCHERSCOPE X-RAY/XDV-SDD -
Helmut Fischer AG
Premium model with universal application characteristicsHighest excitation flexibility, for both the size of the measurement spot and the spectral compositionWith the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolutionVery low detection limits and excellent repeatabilityLarge and easily accessible measurement chamberAutomated series testing with fast, programmable XY-stage
